DocumentCode
1003335
Title
High-voltage single-crystal diamond diodes
Author
Twitchen, D.J. ; Whitehead, A.J. ; Coe, S.E. ; Isberg, J. ; Hammersberg, J. ; Wikström, T. ; Johansson, E.
Author_Institution
Element Six Ltd., Ascot, UK
Volume
51
Issue
5
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
826
Lastpage
828
Abstract
Demonstration of a 2.5-kV diamond diode is provided by electrical measurements using a circular gold Schottky contact, with an area >1 mm2, on large area freestanding single-crystal diamond consisting of a thin high purity layer (<1×1013 [B]/cm3) on a thicker heavily boron-doped (>1×019 [B]/cm3) substrate with an ohmic back contact. The diode structures were fabricated using a microwave-assisted chemical vapor deposition process. The forward properties of the diode show a space charge limited current, with a forward-voltage drop of 2 V and a hole mobility of 4100±400 cm2/Vs at room temperature. For temperatures between 300 K-32/ dependence. This is consistent with acoustic phonon scattering, emphasizing the high purity quality of the top layer in which carrier transport is phonon rather than defect limited.
Keywords
Schottky diodes; chemical vapour deposition; diamond; semiconductor device manufacture; semiconductor diodes; 2.5 kV; C; Schottky contact; acoustic phonon scattering; boron acceptor; boron-doped; carrier mobility; carrier transport; diode structures; forward-voltage drop; high voltage; high-voltage single-crystal diamond diodes; hole mobility; microwave-assisted chemical vapor deposition; space charge; thin high purity layer; Area measurement; Chemical vapor deposition; Electric variables measurement; Gold; Phonons; Schottky barriers; Schottky diodes; Space charge; Temperature; Thickness measurement; Boron acceptor; carrier mobility,; diamond; diode; high voltage; space charge;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2004.826867
Filename
1303847
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