• DocumentCode
    1005243
  • Title

    Alpha-particle-induced failure modes in dynamic RAMs

  • Author

    Carter, P.M. ; Wilkins, B.R.

  • Author_Institution
    Southampton University, Department of Electronics & Information Engineering, Southampton, UK
  • Volume
    21
  • Issue
    1
  • fYear
    1985
  • Firstpage
    38
  • Lastpage
    39
  • Abstract
    The alpha-particle-induced soft error rates of 64K D-RAMs made by five leading manufacturers have been compared. Different samples from the same manufacturer, and those from four different manufacturers, are all shown to be very similar, but the fifth manufacturers product has a soft error rate that is an order of magnitude larger than the others. The results also suggest that, for most products, sensitivity is in the bit lines or sense amplifiers, while for those from the fifth manufacturer it resides in the cells.
  • Keywords
    alpha-particle effects; integrated memory circuits; large scale integration; random-access storage; 64K D-RAMs; alpha-particle-induced soft error rates; bit lines; sense amplifiers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850029
  • Filename
    4250834
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1005243