• DocumentCode
    1005423
  • Title

    Group parity prediction scheme for concurrent testing of linear feedback shift registers

  • Author

    Vasanthavada, N.S.

  • Author_Institution
    Duke University, Department of Electrical Engineering, Durham, USA
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • Firstpage
    67
  • Lastpage
    68
  • Abstract
    A group parity prediction scheme which can be used for concurrent testing of linear feedback shift register circuits is described.
  • Keywords
    logic testing; shift registers; concurrent testing; group parity prediction scheme; linear feedback shift registers; transient fault detection;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850046
  • Filename
    4250853
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1005423