• DocumentCode
    1007036
  • Title

    Effect of Spacer´s Defects and Conducting Particles on the Electric Field Distribution along Their Surfaces in GIS

  • Author

    Radwan, R.M. ; Abou-Elyazied, A.M.

  • Author_Institution
    Cairo Univ., Giza
  • Volume
    14
  • Issue
    6
  • fYear
    2007
  • fDate
    12/1/2007 12:00:00 AM
  • Firstpage
    1484
  • Lastpage
    1491
  • Abstract
    Researches in the area of gas insulated systems (GIS) reliability are still attracting a considerable attention from the electric utilities and the scientific community in many countries. Solid insulating spacers in GIS represent the weakest points in these systems, and several troubles and systems´ outages have been reported all over the world due to their failure. So it is essential to determine the electric field distribution along their surfaces and hence evaluate the degree of their reliability. This paper discusses the electric stress distribution at the solid-gas interface with spacer´s defects and contaminating spherical conducting particles on the surface. The effects of the defects size, type and its location and the particles size and its location on the electric stress distribution at solid-gas interface are presented and discussed.
  • Keywords
    crystal defects; electric field effects; finite element analysis; gas insulated switchgear; power system reliability; surface contamination; GIS reliability; conducting particles; contaminating particles; defect location; defect type; defects size; electric field distribution; electric stress distribution; gas insulated systems; particles location; particles size; solid insulating spacers; solid-gas interface; spacer defects; Dielectric materials; Dielectrics and electrical insulation; Finite element methods; Gas insulation; Geographic Information Systems; Laplace equations; Power system reliability; Solids; Stress; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2007.4401232
  • Filename
    4401232