• DocumentCode
    1007818
  • Title

    Josephson tunnel junctions with refractory electrodes

  • Author

    Raider, S.I.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, New York
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    110
  • Lastpage
    117
  • Abstract
    Fabrication of high quality Josephson tunnel junctions with refractory electrodes is made difficult by the electrode´s short coherence lengths and the sensitivity of the their superconducting properties to tunnel barrier processing. Several innovative procedures have been developed to address this problem. In this review, we describe these tunnel barrier processes and the junction characteristics that were obtained using them. In particular, attention is focused on the junction´s subgap conductance and the reproducibility of the maximum Josephson current because of their importance as device design parameters for integrated circuits.
  • Keywords
    Bibliographies; Josephson devices; Capacitance; Chemicals; Electrical resistance measurement; Electrodes; Energy measurement; Fabrication; Josephson effect; Niobium; Reproducibility of results; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1063615
  • Filename
    1063615