Using a test-specification format in automatic test-program generation

Author

Verhelst, Bas

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

7

Issue

1

fYear

1990

Firstpage

39

Lastpage

45

Abstract

The author suggests that if the information necessary for testing a digital IC or printed-circuit board is kept and transferred in a standardized format, testing will be much easier. He describes the concept of a test-specification format (TSF) and reports the results of experiments with two candidate TSFs. The first, Tandem, is a restricted implementation that uses ITF, aPhilips internal language, to specify tests. The practical use of a TSF was studied by evaluating NCF (neutral code format), a well-documented and stable language. Although the two languages investigated were not true TSFs, the author shows that placing a language between CAD and test systems creates a powerful environment that could greatly reduce test-preparation time and test costs.<>

Keywords

automatic testing; integrated circuit testing; printed circuit testing; CAD; ITF; NCF; Philips internal language; TSFs; Tandem; automatic test-program generation; digital IC; neutral code format; printed-circuit board; stable language; test systems; test-specification format; Automatic testing; Circuit simulation; Circuit testing; Clocks; Electronic equipment testing; Hardware; Performance evaluation; Predictive models; Software testing; Test pattern generators;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/54.46892

Filename

46892