DocumentCode
1009071
Title
Noise measurements of microwave local oscillators
Author
Mueller, R.
Author_Institution
Siemens and Halske A. G. Company
Issue
4
fYear
1954
Firstpage
42
Lastpage
50
Abstract
A method for measuring the spectral distribution of amplitude fluctuations and frequency fluctuations in microwave oscillators is described. The method provides for evaluation of (1) amplitude fluctuations in terms of signal to noise ratio; (2) frequency fluctuations in terms of two parameters: (a) rms deviation; (b) rms rate of change of deviation. In addition, the method permits estimation of the correlation between these two noise components. Some typical results of measurements are described, and certain implications of the effects of system parameters on interpretation of these results are considered. For a specific system, two measurements are shown to be sufficient to determine the effect of frequency noise on system performance.
fLanguage
English
Journal_Title
Electron Devices, Transactions of the IRE Professional Group on
Publisher
ieee
ISSN
0197-6370
Type
jour
DOI
10.1109/T-ED.1954.14028
Filename
1471888
Link To Document