• DocumentCode
    1009071
  • Title

    Noise measurements of microwave local oscillators

  • Author

    Mueller, R.

  • Author_Institution
    Siemens and Halske A. G. Company
  • Issue
    4
  • fYear
    1954
  • Firstpage
    42
  • Lastpage
    50
  • Abstract
    A method for measuring the spectral distribution of amplitude fluctuations and frequency fluctuations in microwave oscillators is described. The method provides for evaluation of (1) amplitude fluctuations in terms of signal to noise ratio; (2) frequency fluctuations in terms of two parameters: (a) rms deviation; (b) rms rate of change of deviation. In addition, the method permits estimation of the correlation between these two noise components. Some typical results of measurements are described, and certain implications of the effects of system parameters on interpretation of these results are considered. For a specific system, two measurements are shown to be sufficient to determine the effect of frequency noise on system performance.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, Transactions of the IRE Professional Group on
  • Publisher
    ieee
  • ISSN
    0197-6370
  • Type

    jour

  • DOI
    10.1109/T-ED.1954.14028
  • Filename
    1471888