• DocumentCode
    1009111
  • Title

    Tunneling and interface structure of oxidized metal barriers on A15 superconductors

  • Author

    Talvacchio, J. ; Braginski, A.I. ; Janocko, M.A. ; Bending, S.J.

  • Author_Institution
    Westinghouse R&D Center, Pittsburgh, PA
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    521
  • Lastpage
    524
  • Abstract
    Al5-based tunnel junctions have been prepared with barriers of oxidized Al; Si, and Y. Properties of the superconductor/barrier interface which are crucial for low-leakage junctions were established by correlating XPS spectra of oxidized bilayers and RHEED patterns of the surface of each layer with tunneling characteristics. Comparisons were made between oxidized Al barrier properties for Nb and Nb3Sn base electrodes. Some differences between evaporated and dc magnetron sputtered barriers have emerged.
  • Keywords
    Magnetic films/devices; Tunnel effect; Atomic layer deposition; Electrodes; High temperature superconductors; Laboratories; Niobium; Niobium-tin; Research and development; Superconducting magnets; Superconductivity; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1063720
  • Filename
    1063720