DocumentCode
1009498
Title
Shelf like of electronic/electrical devices
Author
Polanco, S. ; Behera, A.K.
Author_Institution
Commonwealth Edison Co., Downers Grove, IL, USA
Volume
40
Issue
4
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
809
Lastpage
815
Abstract
Inconsistencies among various industry practices regarding the determination of shelf life for electrical and electronic components are discussed. New methodologies developed to evaluate the shelf life of electrical and electronic components are described, and numerous tests are presented. Based upon testing and analysis using the Arrhenius methodology and typical materials used in the manufacturing of electrical and electronic components, the shelf life of these devices is determined to be indefinite. Various recommendations to achieve an indefinite shelf life are presented to ultimately reduce inventory and operating costs at nuclear power plants
Keywords
ageing; electron device testing; electronic equipment testing; life testing; Arrhenius methodology; electrical devices; electronic components; indefinite shelf life; shelf life; tests; Assembly; Capacitors; Electrical equipment industry; Electronic components; Electronic equipment testing; Electronics industry; Life testing; Maintenance; Manufacturing industries; Power generation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.256666
Filename
256666
Link To Document