• DocumentCode
    1009498
  • Title

    Shelf like of electronic/electrical devices

  • Author

    Polanco, S. ; Behera, A.K.

  • Author_Institution
    Commonwealth Edison Co., Downers Grove, IL, USA
  • Volume
    40
  • Issue
    4
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    809
  • Lastpage
    815
  • Abstract
    Inconsistencies among various industry practices regarding the determination of shelf life for electrical and electronic components are discussed. New methodologies developed to evaluate the shelf life of electrical and electronic components are described, and numerous tests are presented. Based upon testing and analysis using the Arrhenius methodology and typical materials used in the manufacturing of electrical and electronic components, the shelf life of these devices is determined to be indefinite. Various recommendations to achieve an indefinite shelf life are presented to ultimately reduce inventory and operating costs at nuclear power plants
  • Keywords
    ageing; electron device testing; electronic equipment testing; life testing; Arrhenius methodology; electrical devices; electronic components; indefinite shelf life; shelf life; tests; Assembly; Capacitors; Electrical equipment industry; Electronic components; Electronic equipment testing; Electronics industry; Life testing; Maintenance; Manufacturing industries; Power generation;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.256666
  • Filename
    256666