• DocumentCode
    1009630
  • Title

    MeV gamma ray detection algorithms for stacked silicon detectors

  • Author

    McMurray, Robert E. ; Hubbard, G. Scott ; Wercinski, Paul F. ; Keller, Robert G.

  • Author_Institution
    NASA Ames Res. Center Moffett Field, CA, USA
  • Volume
    40
  • Issue
    4
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    882
  • Lastpage
    889
  • Abstract
    By making use of the signature of a gamma ray event as it appears in N=5 to 20 lithium-drifted silicon detectors and applying smart selection algorithms, gamma rays in the energy range of 1 to 8 MeV can be detected with good efficiency and selectivity. Examples of the types of algorithms used for different energy regions include the simple sum mode, the sum-coincidence mode used in segmented detectors, unique variations on sum-coincidence for an N-dimensional vector event, and a new and extremely useful mode for double escape peak spectroscopy at pair-production energies. The latter algorithm yields a spectrum similar to that of the pair spectrometer, but without the need of the dual external segments for double escape coincidence, and without the large loss in efficiency of double escape events. Background events due to Compton scattering are largely suppressed. Monte Carlo calculations are used to model the gamma ray interactions in the silicon, in order to permit testing of wide array of different algorithms on the event N -vectors for a large-N stack
  • Keywords
    Monte Carlo methods; coincidence techniques; gamma-ray detection and measurement; gamma-ray spectroscopy; semiconductor counters; silicon; 1 to 8 MeV; Compton scattering; Monte Carlo calculations; N-dimensional vector event; Si:Li; double escape peak spectroscopy; gamma ray detection algorithms; gamma ray event; large-N stack; pair spectrometer; pair-production energies; segmented detectors; smart selection algorithms; sum mode; sum-coincidence mode; Energy resolution; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Monte Carlo methods; Silicon; Spectroscopy; Temperature; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.256678
  • Filename
    256678