• DocumentCode
    1010295
  • Title

    IGBT fault current limiting circuit

  • Author

    Chokhawala, Rahul ; Castino, Giuseppe

  • Author_Institution
    Motorola Inc., Phoenix, AZ, USA
  • Volume
    1
  • Issue
    5
  • fYear
    1995
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    There is a growing market demand for insulated gate bipolar transistors (IGBTs) with high efficiency but long short-circuit withstand time. The inherent device tradeoff, however, does not allow device designers to achieve both goals simultaneously. The proposed circuits, by limiting the fault current magnitude, extends the short-circuit withstand time of high efficiency (high-gain) IGBTs. Limiting of the fault current magnitude also results in reduced turn-off voltage transients; a desirable byproduct, especially for higher current modules. Moreover, the adverse Miller effect is counterbalanced to a great degree. If the fault current is of a short transient type, the circuit restores normal operation, a unique and desirable feature for noise-prone systems. The circuit does not require an external DC supply to operate. This feature, combined with the simplicity of the circuit, makes it feasible to insert the circuit in IGBT modules or connect it as an interface between the gate driver and module
  • Keywords
    current limiters; insulated gate bipolar transistors; overcurrent protection; power bipolar transistors; power system transients; short-circuit currents; IGBT; adverse Miller effect; efficiency; fault current limiting circuit; fault current magnitude; gain; gate driver; insulated gate bipolar transistors; short transient fault current; short-circuit withstand time; turn-off voltage transients; Circuit faults; Circuit noise; Driver circuits; Fault currents; Insulated gate bipolar transistors; Insulation; Power transistors; Protection; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Journal_Title
    Industry Applications Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1077-2618
  • Type

    jour

  • DOI
    10.1109/2943.407082
  • Filename
    407082