• DocumentCode
    1012521
  • Title

    Correlation between dielectric properties and sintering temperatures of polycrystalline CaCu3Ti4O12

  • Author

    Li, Jianren ; Cho, Kyuho ; Wu, Naijuan ; Ignatiev, Alex

  • Author_Institution
    Coll. of Technol., Houston Univ., USA
  • Volume
    11
  • Issue
    3
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    534
  • Lastpage
    541
  • Abstract
    Dielectric properties of polycrystalline CaCu3Ti4O12 (CCTO) pellets sintered in the temperature range 1000-1200°C were evaluated with impedance spectroscopy at frequency range of 102 to 107 Hz from 90 K to 294 K. A correlation has been established between the pair values of low frequency limit dielectric constant and the total resistivity and the sintering temperature. For example, the sample sintered at 1100°C demonstrates higher value of low frequency limit dielectric constant and lower value of total resistivity, while the sample sintered at 1000°C demonstrates lower values of low frequency limit dielectric constant and higher value of total resistivity. This correlation has been successfully explained by relating with the difference in grain size and grain volume resistivities of these two polycrystalline CCTO samples. Further, it is suggested that donor doping of oxygen vacancies Vo\´ and Vo" may be the reason to cause the difference in the grain volume resistivities of these two samples.
  • Keywords
    calcium compounds; copper compounds; electrical resistivity; grain size; permittivity; sintering; vacancies (crystal); 1000 to 1200 C; 90 to 294 K; CaCu3Ti4O12; dielectric properties; donor doping; grain size; grain volume resistivities; impedance spectroscopy; low frequency limit dielectric constant; oxygen vacancies; polycrystalline pellets; sintering temperature; total resistivity; Conductivity; Dielectric constant; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Grain size; High-K gate dielectrics; Superconducting materials; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2004.1306731
  • Filename
    1306731