• DocumentCode
    1012692
  • Title

    Magnetic properties of ion beam sputtered Co-Zr and Co-Zr-Re amorphous films

  • Author

    Tago, A. ; Nishimura, C. ; Yanagisawa, K.

  • Author_Institution
    NTT Musashino Electrical Communication Laboratories, Tokyo, Japan
  • Volume
    21
  • Issue
    5
  • fYear
    1985
  • fDate
    9/1/1985 12:00:00 AM
  • Firstpage
    2032
  • Lastpage
    2034
  • Abstract
    In this paper, the optimum deposition conditions of amorphous Co-Zr films fabricated by ion beam sputtering and their magnetic properties are investigated. The amorphous state is achieved at a low Zr content ( near 5 - 10 at% ) and is dependent on the substrate temperature. Co-Zr alloy films with a Zr content of 4.5 at% become amorphous on a -130 °C substrate, whereas a Zr content of more than 6 at% is necessary to obtain amorphous films on a 40 °C substrate. The resistivity of the films increases monotonically with Zr content or as the substrate temperature decreases from +300 °C to -130 °C. It is shown that the addition of a small amount of Re to the films decreases magnetostriction, although it lowers saturation magnetization slightly. A magnetostriction value of less than 10-7is obtained when 2 to 3 at%Re is added to the Co-Zr films with a 6 to 8 at%Zr. Ion beam sputtered Co-6 at %Zr-2at% Re in 1 to 3 μm thick amorphous films exhibits the following excellent properties: a saturation magnetization of more than 13 kG, a permeability at 10 MHz of more than 5000, and a Vickers hardness of over 700.
  • Keywords
    Amorphous magnetic films/devices; Magnetic recording/reading heads; Magnetostrictive materials/devices; Amorphous materials; Conductivity; Ion beams; Magnetic films; Magnetic properties; Magnetostriction; Saturation magnetization; Sputtering; Temperature dependence; Zirconium;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1064023
  • Filename
    1064023