Margin analysis of quantum flux parametron logic gates

Author

Hosoya, M. ; Hioe, W.

Author_Institution

Hitachi Ltd., Tokyo, Japan

Volume

3

Issue

2

fYear

1993

fDate

6/1/1993 12:00:00 AM

Firstpage

3022

Lastpage

3028

Abstract

An analytical approach is used to estimate the (quasi-static) margins of quantum flux parametron (QFP) logic gates. The operation of a single QFP is analyzed in detail, and input biases or output variations caused by parameter fluctuations are obtained. The results are used to estimate the margins and yields of the QFP logic gates. The relations between the margin and the parameter fluctuations are obtained. The yields are estimated assuming normal distributions of the fluctuations. The calculations are consistent with experiments performed to date. The static margins of the QFP logic gates discussed here are sufficient, with presently available process technology, for medium size integrated circuits.<>

Keywords

logic gates; superconducting junction devices; superconducting logic circuits; input biases; integrated circuits; logic gates; margin analysis; output variations; parameter fluctuations; quantum flux parametron; single QFP; yields; Electronics packaging; Fluctuations; Inductance; Josephson junctions; Logic circuits; Logic devices; Logic gates; Superconducting devices; Voltage; Yield estimation;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.257229

Filename

257229