• DocumentCode
    1012927
  • Title

    Germanium and silicon transistor structures by the diffused-meltback process employing two or three impurities

  • Author

    Lesk, I.A. ; Gonzalez, R.E.

  • Author_Institution
    General Electric Co., Syracuse, N.Y.
  • Volume
    5
  • Issue
    3
  • fYear
    1958
  • fDate
    7/1/1958 12:00:00 AM
  • Firstpage
    121
  • Lastpage
    126
  • Abstract
    The diffused-meltback process for making transistor structures involves growing a crystal containing a donor and an acceptor impurity, cutting the crystal into pellets, melting and refreezing part of a pellet, and then diffusing. Two impurities may be used to produce high-frequency silicon structures. For best results with germanium, three impurities are required for practical reasons. The two and three-impurity cases are analyzed, and illustrated by graphs and numerical examples. Some characteristic transistor parameters are given to show the applicability of the diffused-meltback process for high-frequency devices.
  • Keywords
    Conductivity; Electron devices; Fabrication; Frequency; Germanium; Heating; Helium; Semiconductor devices; Semiconductor impurities; Silicon; Solids; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1958.14406
  • Filename
    1472449