DocumentCode
1012927
Title
Germanium and silicon transistor structures by the diffused-meltback process employing two or three impurities
Author
Lesk, I.A. ; Gonzalez, R.E.
Author_Institution
General Electric Co., Syracuse, N.Y.
Volume
5
Issue
3
fYear
1958
fDate
7/1/1958 12:00:00 AM
Firstpage
121
Lastpage
126
Abstract
The diffused-meltback process for making transistor structures involves growing a crystal containing a donor and an acceptor impurity, cutting the crystal into pellets, melting and refreezing part of a pellet, and then diffusing. Two impurities may be used to produce high-frequency silicon structures. For best results with germanium, three impurities are required for practical reasons. The two and three-impurity cases are analyzed, and illustrated by graphs and numerical examples. Some characteristic transistor parameters are given to show the applicability of the diffused-meltback process for high-frequency devices.
Keywords
Conductivity; Electron devices; Fabrication; Frequency; Germanium; Heating; Helium; Semiconductor devices; Semiconductor impurities; Silicon; Solids; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1958.14406
Filename
1472449
Link To Document