• DocumentCode
    1015252
  • Title

    Scalar calibration of quasi-optical reflection measurements

  • Author

    Koers, Gaetan ; Stiens, Johan ; Vounckx, Roger

  • Author_Institution
    Lab. for Micro- & Opto-Electron., Vrije Univ., Brussels, Belgium
  • Volume
    54
  • Issue
    7
  • fYear
    2006
  • fDate
    7/1/2006 12:00:00 AM
  • Firstpage
    3121
  • Lastpage
    3126
  • Abstract
    For accurate calibrated measurements, calibration procedures tend to rely on the acquisition of vector data by means of heterodyning or multiport power measurements. In this paper, we propose a novel scalar one-port calibration method for quasi-optical frequency response measurements. Only uncalibrated reference and reflected power detectors are needed for accurate results within specified error bounds. Calibration is based on a modified match-short-short procedure, and scalar reflection of the sample is calculated from two measurement points per frequency. The effectiveness of the method is illustrated with two experimental cases measured over the full W-band.
  • Keywords
    calibration; electromagnetic wave reflection; microwave reflectometry; optical variables measurement; calibrated measurements; match-short-short procedure; quasi-optical frequency; quasi-optical reflection measurement; quasi-optics; reflected power detectors; scalar calibration; scalar one-port calibration; scalar reflection; un-calibrated reference; Calibration; Dielectric loss measurement; Dielectric measurements; Frequency measurement; Frequency response; Microwave measurements; Optical reflection; Permittivity measurement; Power measurement; Slabs; Calibration; millimeter; quasi-optics; reflection measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2006.877049
  • Filename
    1650454