DocumentCode
1015252
Title
Scalar calibration of quasi-optical reflection measurements
Author
Koers, Gaetan ; Stiens, Johan ; Vounckx, Roger
Author_Institution
Lab. for Micro- & Opto-Electron., Vrije Univ., Brussels, Belgium
Volume
54
Issue
7
fYear
2006
fDate
7/1/2006 12:00:00 AM
Firstpage
3121
Lastpage
3126
Abstract
For accurate calibrated measurements, calibration procedures tend to rely on the acquisition of vector data by means of heterodyning or multiport power measurements. In this paper, we propose a novel scalar one-port calibration method for quasi-optical frequency response measurements. Only uncalibrated reference and reflected power detectors are needed for accurate results within specified error bounds. Calibration is based on a modified match-short-short procedure, and scalar reflection of the sample is calculated from two measurement points per frequency. The effectiveness of the method is illustrated with two experimental cases measured over the full W-band.
Keywords
calibration; electromagnetic wave reflection; microwave reflectometry; optical variables measurement; calibrated measurements; match-short-short procedure; quasi-optical frequency; quasi-optical reflection measurement; quasi-optics; reflected power detectors; scalar calibration; scalar one-port calibration; scalar reflection; un-calibrated reference; Calibration; Dielectric loss measurement; Dielectric measurements; Frequency measurement; Frequency response; Microwave measurements; Optical reflection; Permittivity measurement; Power measurement; Slabs; Calibration; millimeter; quasi-optics; reflection measurement;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2006.877049
Filename
1650454
Link To Document