• DocumentCode
    1017468
  • Title

    Uniform turn-on in four-layer diodes

  • Author

    Hubner, K. ; Melehy, M. ; Biesele, R.L.

  • Author_Institution
    Stanford Industrial Park, Palo Alto, Calif.
  • Volume
    8
  • Issue
    6
  • fYear
    1961
  • Firstpage
    461
  • Lastpage
    464
  • Abstract
    The turn-on characteristics of 200-volt four-layer diodes have been investigated as a function of the rate of rise of the applied voltage close to the breakover point. A fast rate of rise of the order of kv/µsec allows bringing the voltage up to, or higher than, the designed avalanche voltage of the center junction, even if localized spots having a lower breakdown voltage are present. Such spots, possibly due to crystalline defects, surface conditions and statistical or accidental variations of impurity concentration, may lead to localized turn-on and possible burn out. There is experimental evidence that a fast rate of rise results in uniform turn-on and allows current densities up to 55,000 a/cm2without damaging the device.
  • Keywords
    Acceleration; Breakdown voltage; Cooling; Diodes; Electron beams; Electron emission; Noise reduction; Optical propagation; Space technology; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1961.14863
  • Filename
    1473026