• DocumentCode
    1017554
  • Title

    A new COG technique using low temperature solder bumps for LCD driver IC packaging applications

  • Author

    Kang, Un-Byoung ; Kim, Young-Ho

  • Author_Institution
    Div. of Mater. Sci. & Eng., Hanyang Univ., Seoul, South Korea
  • Volume
    27
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    253
  • Lastpage
    258
  • Abstract
    A new chip on glass (COG) technique using flip chip solder joining technology has been developed for excellent resolution and high quality liquid crystal display (LCD) panels. The flip chip solder joining technology has several advantages over the anisotropic conductive film (ACF) bonding technology: finer pitch capability, better electrical performance, and easier reworkability. Conventional solders such as eutectic Pb-Sn and Pb-5Sn require high temperature processing which can lead to degradation of the liquid crystal or the color filter in LCD modules. Thus it is desirable to develop a low temperature process below 160°C using solders with low melting temperatures for this application. In our case, we used eutectic 58 wt%Bi-42 wt%Sn solder for this purpose. Using the eutectic Bi-Sn solder bumps of 50-80μm pitch sizes, an ultrafine interconnection between the IC and glass substrate was successfully made at or below 160°C. The average contact resistance of the Bi-Sn solder joints was 19mΩ per bump, which is much lower than the contact resistance of conventional ACF bonding technologies. The contact resistance of the underfilled Bi-Sn solder joints did not change during a hot humidity test. We demonstrate that the COG technique using low temperature solder joints can be applied to advanced LCDs that lead to require excellent quality, high resolution, and low power consumption.
  • Keywords
    bismuth alloys; contact resistance; eutectic alloys; flip-chip devices; integrated circuit packaging; liquid crystal displays; soldering; substrates; tin alloys; BiSn; anisotropic conductive film; chip on glass technique; color filter; contact resistance; electrical performance; finer pitch capability; flip chip solder; glass substrate; liquid crystal display; low melting point solder; low power consumption; solder bumps; Anisotropic conductive films; Bonding; Contact resistance; Flip chip; Glass; Integrated circuit packaging; Lead; Liquid crystal displays; Soldering; Temperature; Bi–Sn; COG; LCD; chip on glass; flip chip; liquid crystal display; solder bump;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.828585
  • Filename
    1308445