DocumentCode
1018157
Title
Broad aspects of the interaction in parametric devices
Author
Evans, H.J. ; Hsu, Hua-Chih
Author_Institution
General Electric Company, Syracuse, N. Y.
Volume
9
Issue
1
fYear
1962
Firstpage
114
Lastpage
114
Keywords
Capacitance; Circuit noise; Conductivity; Electrical resistance measurement; Electromagnetic scattering; Fabrication; Geometry; Packaging; Phonons; Photonic crystals; Semiconductor device noise; Semiconductor diodes; Semiconductor materials; Varactors;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1962.14928
Filename
1473156
Link To Document