• DocumentCode
    1018811
  • Title

    Transmission Lorentz microscopy of two-layered Co80Nb10Ti10films

  • Author

    Tsukahara, S. ; Morita, H. ; Yamamoto, M. ; Fujimori, H.

  • Author_Institution
    Electrotechnical Laboratory, Tokyo, Japan
  • Volume
    22
  • Issue
    5
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    775
  • Lastpage
    777
  • Abstract
    Magnetic domain structures in two layered 300-550 A thick Co80Nb10Ti10films with magnetostatic coupling across nonmagnetic layer with thickness d from 8 to 800 A were examined through transmission Lorentz microscopy at 200 kV. At d= 20 A the coupling of two layers is strongest and two layers are magnetized in parallel direction except the coupled Néel wall regions. At d=40-160 A domains in two layers are magnetized in independent directions but strong coupling between the domain walls in both layers causes complicated domain configuration. The characteristic vertical pair domains and 90° walls play a role to result flux closure between the layers. The maximum thickness of 180° wall reaches 4000 A at this d range.
  • Keywords
    Amorphous magnetic films/devices; Electron microscopy; Magnetic domains; Amorphous magnetic materials; Couplings; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic separation; Magnetostriction; Perpendicular magnetic anisotropy; Saturation magnetization; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1986.1064552
  • Filename
    1064552