DocumentCode
1018836
Title
High-resolution analysis of exponentially decaying transients for physics d.l.t.s. experiments
Author
Hodgart, M.S.
Author_Institution
University of Surrey, Department of Electronic and Electrical Engineering, Guildford, UK
Volume
15
Issue
22
fYear
1979
Firstpage
724
Lastpage
725
Abstract
A class of analysing functions is proposed to improve the resolution of the measurement of exponential transients in d.l.t.s. experiments. These functions offer a trade-off between resolution and sensitivity to noise as measured by a signal/noise ratio. Implementation may be by either analogue or digital (point sampling) correlation.
Keywords
deep levels; transients; DLTS experiments; analogue correlation; analysing functions; deep level transient spectroscopy experiments; digital correlation; exponentially decaying transients; resolution analysis; semiconductor; signal/noise ratio;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19790515
Filename
4256138
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