DocumentCode
1019451
Title
Electrode effects on aluminum oxide tunnel junctions
Author
Handy, R.M.
Author_Institution
Westinghouse Research Laboratories
Volume
9
Issue
6
fYear
1962
Firstpage
508
Lastpage
508
Keywords
Aluminum oxide; Attenuation; Capacitance; Current density; Electrodes; Electromagnetic scattering; Electrons; Gold; Ohmic contacts; Particle scattering; Semiconductor films; Silicon; Temperature; Transistors;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1962.15053
Filename
1473281
Link To Document