• DocumentCode
    1020679
  • Title

    Correction factor curves for square-array and rectangular-array four-point probes near conducting or nonconducting boundaries

  • Author

    Catalano, S.B.

  • Author_Institution
    The Bendix Corporation, Southfield, Mich.
  • Volume
    10
  • Issue
    3
  • fYear
    1963
  • fDate
    5/1/1963 12:00:00 AM
  • Firstpage
    185
  • Lastpage
    188
  • Abstract
    Resistivity measurements made with a four-point probe on a sample having at least one of its dimensions small (i. e., of the order of the spacing between the points of the probe or smaller) require a correction factor to compensate for this condition. Correction factors for various four-point probe arrangements near a conducting or a nonconducting boundary have been derived and plotted for cases where : 1) the four-point probe array is rectangular and of various proportions rather than square, 2) the current points of the square-or rectangular-array probe are perpendicular to the boundary 3) the current points of the square-or rectangular-array probe are parallel to the boundary.
  • Keywords
    Books; Conductivity; Current measurement; Equations; Germanium; Instruments; Probes; Semiconductor materials; Testing;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1963.15173
  • Filename
    1473476