• DocumentCode
    1020893
  • Title

    Modeling the Centroid and the Inversion Charge in Cylindrical Surrounding Gate MOSFETs, Including Quantum Effects

  • Author

    Roldán, J.B. ; Godoy, Andrés ; Gámiz, Francisco ; Balaguer, M.

  • Author_Institution
    Univ. de Granada, Granada
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    411
  • Lastpage
    416
  • Abstract
    A semiempirical model was developed for calculating the inversion charge of cylindrical surrounding gate transistors (SGTs), including quantum effects. To achieve this goal, we used a simulator that self-consistently solves the 2-D Poisson and Schrodinger equations in a cross section of the SGT. By means of the proposed models, we correctly reproduced the simulation data for a wide range of the device radius and gate voltage values. Both the inversion charge and the centroid models consist of simple mathematical equations within an explicit calculation scheme suitable for use in circuit simulators.
  • Keywords
    MOSFET; Poisson equation; Schrodinger equation; quantum theory; semiconductor device models; 2-D Poisson equations; MOSFET; Schrodinger equations; centroid models; cylindrical-surrounding gate transistors; inversion charge; quantum effects; semiempirical model; Circuit simulation; Degradation; Helium; Impurities; MOSFETs; Mathematical model; Poisson equations; Schrodinger equation; Silicon on insulator technology; Threshold voltage; Gate all around MOSFET (GAA MOSFET); inversion charge centroid; inversion charge model; inversion charge modelling including quantum effects; silicon-on-insulator (SOI); surrounding gate transistor (SGT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911096
  • Filename
    4408807