DocumentCode
1020893
Title
Modeling the Centroid and the Inversion Charge in Cylindrical Surrounding Gate MOSFETs, Including Quantum Effects
Author
Roldán, J.B. ; Godoy, Andrés ; Gámiz, Francisco ; Balaguer, M.
Author_Institution
Univ. de Granada, Granada
Volume
55
Issue
1
fYear
2008
Firstpage
411
Lastpage
416
Abstract
A semiempirical model was developed for calculating the inversion charge of cylindrical surrounding gate transistors (SGTs), including quantum effects. To achieve this goal, we used a simulator that self-consistently solves the 2-D Poisson and Schrodinger equations in a cross section of the SGT. By means of the proposed models, we correctly reproduced the simulation data for a wide range of the device radius and gate voltage values. Both the inversion charge and the centroid models consist of simple mathematical equations within an explicit calculation scheme suitable for use in circuit simulators.
Keywords
MOSFET; Poisson equation; Schrodinger equation; quantum theory; semiconductor device models; 2-D Poisson equations; MOSFET; Schrodinger equations; centroid models; cylindrical-surrounding gate transistors; inversion charge; quantum effects; semiempirical model; Circuit simulation; Degradation; Helium; Impurities; MOSFETs; Mathematical model; Poisson equations; Schrodinger equation; Silicon on insulator technology; Threshold voltage; Gate all around MOSFET (GAA MOSFET); inversion charge centroid; inversion charge model; inversion charge modelling including quantum effects; silicon-on-insulator (SOI); surrounding gate transistor (SGT);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.911096
Filename
4408807
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