• DocumentCode
    1021801
  • Title

    Note on contrast measures and polynomial classifiers

  • Author

    Sanz, Jorge L C ; Hinkle, Eric B.

  • Author_Institution
    IBM Almaden Res. Center, San Jose, CA, USA
  • Volume
    76
  • Issue
    3
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    296
  • Abstract
    The application of a contrast measure for segmenting images and the relationship of this method to polynomial-based classification are considered. The relevance of the segmentation method is shown by applying the contrast measure to a semiconductor manufacturing inspection problem. The contrast measure is shown to be a particular case of a pixel classification technique based on polynomial decision functions and local texture features. This relationship integrates an important heuristic method with the rigorous theory of decision-theoretic classification
  • Keywords
    inspection; picture processing; semiconductor device manufacture; contrast measures; decision-theoretic classification; heuristic method; inspection problem; local texture features; pixel classification technique; polynomial classifiers; segmentation method; Computer science; Image edge detection; Image enhancement; Image segmentation; Inspection; Measurement standards; Particle measurements; Polynomials; Region 4; Semiconductor device manufacture;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.4412
  • Filename
    4412