• DocumentCode
    1022097
  • Title

    Temperature-dependent properties of niobium nitride Josephson tunnel junctions

  • Author

    Shoji, A. ; Aoyagi, M. ; Kosaka, S. ; Shinoki, F.

  • Author_Institution
    Electrotechnical Laboratory, Ibaraki, Japan
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1464
  • Lastpage
    1471
  • Abstract
    We report the electrical properties of all niobium nitride(NbN) Josephson tunnel junctions with magnesium oxide(MgO) films as barriers in the temperature range 4.2-15 K. NbN/MgO/NbN Josephson tunnel junctions have large gap voltages(Vg=4.8-5.4 mV), large products of the maximum critical currents and the normal tunneling resistances(IcRn=3.15-3.35 mV), and small subgap leakage currents(Vm=13-138 mV) at 4.2 K. The junction parameters decreased with increase in temperature, but reasonably large junction parameters(for example, Vg=4.9 mV, IcRn=2.67 mV, and Vm=22 mV) have been obtained even at 9 K. The magnetic penetration depth in NbN electrodes has been measured up to 15 K using two-junction interferometers which consist of NbN/MgO/NbN junctions, NbN ground planes, and NbN control lines.
  • Keywords
    Josephson radiation in superconductor/insulator superlattices; Critical current; Current measurement; Electric variables measurement; Electrodes; Leakage current; Magnesium; Magnetic properties; Magnetic tunneling; Niobium compounds; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1064829
  • Filename
    1064829