DocumentCode
1022097
Title
Temperature-dependent properties of niobium nitride Josephson tunnel junctions
Author
Shoji, A. ; Aoyagi, M. ; Kosaka, S. ; Shinoki, F.
Author_Institution
Electrotechnical Laboratory, Ibaraki, Japan
Volume
23
Issue
2
fYear
1987
fDate
3/1/1987 12:00:00 AM
Firstpage
1464
Lastpage
1471
Abstract
We report the electrical properties of all niobium nitride(NbN) Josephson tunnel junctions with magnesium oxide(MgO) films as barriers in the temperature range 4.2-15 K. NbN/MgO/NbN Josephson tunnel junctions have large gap voltages(Vg =4.8-5.4 mV), large products of the maximum critical currents and the normal tunneling resistances(Ic Rn =3.15-3.35 mV), and small subgap leakage currents(Vm =13-138 mV) at 4.2 K. The junction parameters decreased with increase in temperature, but reasonably large junction parameters(for example, Vg =4.9 mV, Ic Rn =2.67 mV, and Vm =22 mV) have been obtained even at 9 K. The magnetic penetration depth in NbN electrodes has been measured up to 15 K using two-junction interferometers which consist of NbN/MgO/NbN junctions, NbN ground planes, and NbN control lines.
Keywords
Josephson radiation in superconductor/insulator superlattices; Critical current; Current measurement; Electric variables measurement; Electrodes; Leakage current; Magnesium; Magnetic properties; Magnetic tunneling; Niobium compounds; Temperature distribution;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1064829
Filename
1064829
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