DocumentCode
1022836
Title
Charge-storage effects in silicon dioxide films
Author
Yamin, M.
Volume
11
Issue
11
fYear
1964
fDate
11/1/1964 12:00:00 AM
Firstpage
531
Lastpage
532
Keywords
Insulation; Laboratories; Magnetic field measurement; Magnetic fields; Plasma temperature; Plasma waves; Semiconductor films; Silicon compounds; Solid state circuits; Surface discharges;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1964.15391
Filename
1473779
Link To Document