DocumentCode
1023953
Title
Modified Fukui model for high-frequency MESFETs
Author
Oxley, C.H. ; Holden, A.J.
Author_Institution
Plessey Research (Caswell) Ltd., Towcester, UK
Volume
22
Issue
13
fYear
1986
Firstpage
690
Lastpage
692
Abstract
The letter will describe a modified form of the Fukui noise model to describe the high-frequency noise performance of MESFETs.
Keywords
Schottky gate field effect transistors; electron device noise; semiconductor device models; solid-state microwave devices; Fukui noise model; MESFETs; MM-wave frequency range; high-frequency noise performance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860472
Filename
4256671
Link To Document