• DocumentCode
    1025597
  • Title

    Precise delay generation using coupled oscillators

  • Author

    Maneatis, John G. ; Horowitz, Mark A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    28
  • Issue
    12
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    1273
  • Lastpage
    1282
  • Abstract
    A new delay generator based on a series of coupled ring oscillators has been developed; it produces precise delays with subgate delay resolution for chip testing applications. It achieves a delay resolution equal to a buffer delay divided by the number of rings. The coupling employed forces the outputs of a linear array of ring oscillators oscillating at the same frequency to be uniformly offset in phase by a precise fraction of a buffer delay. The buffer stage used in the ring oscillators is based on a source-coupled pair and achieves high supply noise rejection while operating at low supply voltages. Experimental results from a 2-μm N-well CMOS implementation of the delay generator demonstrate that it can achieve an output delay resolution of 101 ps while operating at 141 MHz with a peak error of 58 ps
  • Keywords
    CMOS integrated circuits; buffer circuits; delay circuits; integrated circuit testing; oscillators; test equipment; 101 ps; 141 MHz; 2 micron; N-well CMOS implementation; buffer stage; chip testing applications; coupled oscillators; delay generator; precise delay generation; ring oscillators; source-coupled pair; subgate delay resolution; Circuit testing; Clocks; Delay; Frequency; Integrated circuit technology; Integrated circuit testing; Low voltage; Phased arrays; Ring oscillators; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.262000
  • Filename
    262000