Electrothermal simulation of integrated circuits

Author

Lee, Sang-Soo ; Allstot, David J.

Author_Institution

Micro Linear Corp., San Jose, CA, USA

Volume

28

Issue

12

fYear

1993

fDate

12/1/1993 12:00:00 AM

Firstpage

1283

Lastpage

1293

Abstract

This paper describes new techniques for simulating the DC and steady-state thermal characteristics of integrated circuits using the incomplete Choleski conjugate gradient (ICCG) method, and transient electrothermal performance using an efficient macromodeling method based on asymptotic waveform evaluation (AWE). Results on several benchmark circuits show orders of magnitude reductions in CPU time and memory with accuracy comparable to that of the traditional techniques

Keywords

circuit analysis computing; conjugate gradient methods; digital simulation; equivalent circuits; integrated circuit technology; monolithic integrated circuits; thermal analysis; transient response; DC characteristics; asymptotic waveform evaluation; electrothermal simulation; incomplete Choleski conjugate gradient method; integrated circuits; macromodeling method; steady-state thermal characteristics; transient electrothermal performance; Circuit simulation; Computational modeling; Electrothermal effects; Integrated circuit modeling; Packaging; Power dissipation; Steady-state; Temperature; Very large scale integration; Voltage;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.262001

Filename

262001