DocumentCode
1026245
Title
Virtual Inspector: A Flexible Visualizer for Dense 3D Scanned Models
Author
Callieri, Marco ; Ponchio, Federico ; Cignoni, Paolo ; Scopigno, Roberto
Author_Institution
Italian Nat. Res. Council, Pisa
Volume
28
Issue
1
fYear
2008
Firstpage
44
Lastpage
54
Abstract
Virtual inspector lets novice users inspect dense 3D models at interactive frame rates on commodity PCs. The system obtains visualization efficiency without sacrificing quality by adopting a continuous level-of-detail representation. Visual inspector´s use of XML to encode the GUI´s structure and behavior makes it flexible and configurable. We can improve the virtual inspector system by adding new functionality and increasing its efficiency. Few restorers would consider the simple visualization of a digital 3D replica as the ultimate goal for the use of 3D scanning technologies in cultural heritage contexts. Once we can visualize an artifact with great accuracy, the need to map other data on the 3D model will rise. We´re working on a slightly extended version of the tool to support mapping and selective visualization of different sources of surface data. We´re also developing tools to compute measures. Finally, we´re working to more dynamically enrich the data linked to the mesh by letting users add annotations or link multimedia material to selected points of the artifact surface. Our goal is to transform virtual inspector into a more dynamic instrument for cultural heritage research and restoration.
Keywords
XML; data visualisation; graphical user interfaces; solid modelling; virtual reality; 3D scanned model; GUI structure; XML; data visualization; flexible visualizer; interactive frame rate; virtual inspector; Computer graphics; Cultural differences; Data visualization; Geometry; Personal communication networks; Protection; Rendering (computer graphics); Usability; Virtual reality; Workstations; 3D scanning; GUI; cultural heritage; large data visualization;
fLanguage
English
Journal_Title
Computer Graphics and Applications, IEEE
Publisher
ieee
ISSN
0272-1716
Type
jour
DOI
10.1109/MCG.2008.20
Filename
4418750
Link To Document