• DocumentCode
    1026583
  • Title

    Magnetic properties of NiFe films prepared using ion-beam sputtering

  • Author

    Nishimura, C. ; Nagai, Y. ; Yanagisawa, K. ; Toshima, T.

  • Author_Institution
    NTT Electrical Communication Laboratories, Tokyo, Japan
  • Volume
    23
  • Issue
    5
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    2728
  • Lastpage
    2730
  • Abstract
    The magnetic properties of NiFe films in the thickness range of 1 to 3 μm prepared using ion-beam sputtering were investigated by varying parameters such as the grid system, composition ratio of the targets, accelerator voltage and the beam current bombarding the substrate. The effects of the ion-assist voltage and ion-assist current on magnetic and electrical properties were investigated and the deposition conditions for NiFe films with low coercive force and resistivity were clarified. Due to their optimization of the ion-assist voltage and current, the ion-beam sputtered NiFe films have the low coercive force and resistivity necessary for thin film head applications.
  • Keywords
    Ion radiation effects; Magnetic films/devices; Nickel materials/devices; Accelerator magnets; Coercive force; Conductivity; Ion accelerators; Magnetic films; Magnetic properties; Particle beams; Sputtering; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1065239
  • Filename
    1065239