DocumentCode

1026611

Title

Statistical phenomena associated with Si-SiO2interface states

Author

Nicollian, E.H. ; Goetzberger, A.

Author_Institution

Bell Telephone Laboratories, Inc.

Issue

42591

fYear

1966

Firstpage

674

Lastpage

674

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1966.15784

Filename

1474374