• DocumentCode
    1027208
  • Title

    The area of safe operation of transistors for switching operation

  • Author

    Oda, H.

  • Author_Institution
    Mitsubishi Electric Corporation, Kamakura City, Kanagawa Prefecture, Japan
  • Issue
    11
  • fYear
    1966
  • Firstpage
    776
  • Lastpage
    777
  • Abstract
    A thermal feedback model is presented for the analytical definition of the ASO (Area of Safe Operation) for transistors in switching operations. This area is narrowed by the "second breakdown in p-n junction," and the approximate representation of the breakdown threshold is presented. This model consists of a forward and feedback energy flow with gains A and B, respectively. A = V_{CE} \\times M, B = K \\times \\theta \\times \\alpha _{R} \\times I_{e} . Therefore, the condition of the breakdown can be introduced as 1 - AB = 0 , where M is the current multiplication factor, θ is transient thermal resistance, K is a newly introduced current concentration factor, and αRis the temperature coefficient of Ie. Experimental results are also reported for a germanium alloy type transistor.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1966.15842
  • Filename
    1474432