DocumentCode
1027208
Title
The area of safe operation of transistors for switching operation
Author
Oda, H.
Author_Institution
Mitsubishi Electric Corporation, Kamakura City, Kanagawa Prefecture, Japan
Issue
11
fYear
1966
Firstpage
776
Lastpage
777
Abstract
A thermal feedback model is presented for the analytical definition of the ASO (Area of Safe Operation) for transistors in switching operations. This area is narrowed by the "second breakdown in p-n junction," and the approximate representation of the breakdown threshold is presented. This model consists of a forward and feedback energy flow with gains A and B, respectively.
. Therefore, the condition of the breakdown can be introduced as
, where
is the current multiplication factor, θ is transient thermal resistance,
is a newly introduced current concentration factor, and αR is the temperature coefficient of Ie . Experimental results are also reported for a germanium alloy type transistor.
. Therefore, the condition of the breakdown can be introduced as
, where
is the current multiplication factor, θ is transient thermal resistance,
is a newly introduced current concentration factor, and αfLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1966.15842
Filename
1474432
Link To Document