• DocumentCode
    1027327
  • Title

    Software testing based on SDL specifications with save

  • Author

    Luo, Gang ; Das, Anindya ; Bochmann, Gregor V.

  • Author_Institution
    Dept. d´´Inf. et de Recherche Oper., Montreal Univ., Que., Canada
  • Volume
    20
  • Issue
    1
  • fYear
    1994
  • fDate
    1/1/1994 12:00:00 AM
  • Firstpage
    72
  • Lastpage
    87
  • Abstract
    The signal save construct is one of the features distinguishing SDL from traditional high-level specification and programming languages. However, this feature increases the difficulties of testing SDL-specified software. We present a testing approach consisting of the following three phases: SDL specifications are first abstracted into finite state machines with save constructs, called SDL-machines; the resulting SDL-machines are then transformed into equivalent finite state machines without save constructs if this is possible; and, finally, test cases are selected from the resulting finite state machines. Since there are many existing methods for the first and third phases, we mainly concentrate upon the second phase and come up with a method of transforming SDL-machines into equivalent finite state machines, which preserve the same input/output relationship as in the original SDL-machines. The transformation method is useful not only for testing but also for verifying SDL-specified software
  • Keywords
    finite state machines; formal specification; program testing; program verification; specification languages; SDL specifications; SDL-machine transformation; SDL-machines; finite state machines; high-level specification; input/output relationship; programming languages; signal save construct; software testing; software verification; Application software; Automata; Communication industry; Communication standards; Computer languages; Computer science; Formal specifications; Protocols; Software standards; Software testing;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.263756
  • Filename
    263756