• DocumentCode
    1029860
  • Title

    A sensitive, temperature-compensated, zero-bias floating gate MOSFET dosimeter

  • Author

    Tarr, N. Garry ; Shortt, Ken ; Wang, Yanbin ; Thomson, Ian

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
  • Volume
    51
  • Issue
    3
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    1277
  • Lastpage
    1282
  • Abstract
    A new MOSFET dosimeter consisting of a floating gate sensor transistor and a reference transistor of identical geometry fabricated in close proximity on the same silicon chip is described. Sensitivity is maximized by not overlapping the floating gate with a control gate. The floating gate is precharged prior to irradiation by tunneling. No bias is applied during irradiation. The dosimeter output is the reference transistor gate bias required to give the same drain current in the sensor and reference MOSFETs at the same drain-source bias. Sensitivities up to 3 mV/rad have been achieved. The dosimeter provides excellent first-order temperature compensation. With second-order temperature compensation using an external temperature sensor, doses less than 500 mrad should be resolvable.
  • Keywords
    MOSFET; dosimeters; dosimetry; gamma-ray detection; nuclear electronics; radiation monitoring; readout electronics; CMOS; RADFET; control gate; drain current; drain-source bias; external temperature sensor; first-order temperature compensation; floating gate precharging characteristic; floating gate sensor transistor; gamma rays; irradiation phenomena; radiation sensing MOSFET; readout circuit; reference transistor gate bias; second-order temperature compensation; sensitive temperature-compensated zero-bias floating gate MOSFET dosimeter; silicon chip; tunneling; Biomedical measurements; CMOS technology; Councils; Geometry; Ionizing radiation; MOSFET circuits; Silicon; Temperature control; Temperature sensors; Tunneling; CMOS; MOSFET; RADFET; detector; dosimetry; gamma rays;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.829372
  • Filename
    1310612