• DocumentCode
    1029948
  • Title

    An adaptive thin-film transistor

  • Author

    Perlman, Stuart S. ; Ludewig, Karl H.

  • Author_Institution
    RCA Laboratories, Princeton, N. J.
  • Volume
    14
  • Issue
    12
  • fYear
    1967
  • fDate
    12/1/1967 12:00:00 AM
  • Firstpage
    816
  • Lastpage
    821
  • Abstract
    A thin-film transistor (TFT) is described whose transfer characteristic can be reversibly adapted by a short duration voltage pulse applied to a high impedance gate electrode. The device is a four-terminal two-gate structure. A source, drain, and insulator gate contact form the basic TFT, while the amount and polarity of the polarization charge on the surface of the ferroelectric material of a second gate contact determines the pinchoff voltage of the TFT transfer characteristic. Measurements on experimental units demonstrate that the pinchoff voltage is adjustable over a sizable range, and that TFT transconductance changes in excess of 1000 to 1 can be obtained. The time required to change between different states of the TFT characteristic is limited by the switching time of the ferroelectric material which, in general, can be of the order of microseconds. Electrical instabilities in the transfer characteristics of the devices, however, may limit their practical circuit application. The instabilities are observed as a slow time variation of pinchoff voltage after a state has been established. Experimental units use triglycine sulfate for the ferroelectric material and tellurium-silicon monoxide thin film transistors.
  • Keywords
    Electrodes; Ferroelectric materials; Insulation; Measurement units; Polarization; Size measurement; Surface impedance; Thin film transistors; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.16115
  • Filename
    1474838