• DocumentCode
    1030412
  • Title

    Resonant tunnelling gate field-effect transistor

  • Author

    Capasso, Federico ; Sen, Satyaki ; Beltram, F. ; Cho, Andrew Y.

  • Author_Institution
    AT&T Bell Laboratories, Murray Hill, USA
  • Volume
    23
  • Issue
    5
  • fYear
    1987
  • Firstpage
    225
  • Lastpage
    226
  • Abstract
    A new negative differential resistance field-effect transistor concept, based on resonant tunnelling, is demonstrated. The gate of this novel device consists of an AlAs/GaAs double barrier. The drain current against drain and gate voltages exhibit a peak due to the quenching of the resonant tunneling gate current. Thus, in addition to negative conductance, this structure exhibits negative transconductance, a uniquie feature in an n-channel device.
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistors; gallium arsenide; semiconductor junctions; tunnelling; AlAs-GaAs double barrier gate; current voltage curves; drain current; n-channel device; negative differential resistance; negative transconductance; resonant tunnelling gate FET; resonant tunnelling gate current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870158
  • Filename
    4257484