DocumentCode
1030584
Title
Magnetic anisotropy of Co-Cr thin films as a function of substrate temperature during deposition
Author
Mountfield, K.R. ; Mitchell, P.V. ; Lee, J.W. ; Demczyk, B.G. ; Artman, J.O.
Author_Institution
Carnegie Mellon University, Pittsburgh, Pennsylvania, USA
Volume
23
Issue
5
fYear
1987
fDate
9/1/1987 12:00:00 AM
Firstpage
2037
Lastpage
2039
Abstract
A sequence of Co78 Cr22 films, 500 nm in thickness, was prepared by deposition on glass in a modified Varian D.C. magnetron S-gun sputtering system. The substrate temperature during deposition, Ts , was fixed at various values with an upper limit of 300°C. Specimens were examined by VSM, TM, FMR and TEM. Ms rises significantly with increasing Ts , peaking at 200°C at 370 emu/cm3. The effective volume-averaged anisotropy drops for Ts >110°C from +1.6 KOe to progressively negative values (-4.3 KOe at 300°C). From FMR we find indications of the presence, in addition to the transition and bulk layers, of a highly negative anisotropy constituent (
KOe anisotropy field). This resonance appears at Ts values of 150°C and above. TEM plane and cross-section views taken on a Ts = 150°C specimen show islands composed of tilted columns within the bulk. For vertical recording, specimens prepared at Ts values between 50 and 100°C are recommended. On the other hand, for longitudinal recording applications, films prepared at Ts values above 250°C would seem to be appropriate.
KOe anisotropy field). This resonance appears at TKeywords
Magnetic anisotropy; Magnetic thermal factors; Perpendicular magnetic recording; Anisotropic magnetoresistance; Chromium; Glass; Magnetic anisotropy; Magnetic films; Magnetic resonance; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Sputtering; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1065606
Filename
1065606
Link To Document