• DocumentCode
    1033874
  • Title

    Gunn effect bibliography

  • Author

    Gaylord, Thomas K. ; Shah, Pradeep L. ; Rabson, Thomas A.

  • Author_Institution
    Rice University, Houston, Tex.
  • Volume
    15
  • Issue
    10
  • fYear
    1968
  • fDate
    10/1/1968 12:00:00 AM
  • Firstpage
    777
  • Lastpage
    788
  • Abstract
    In view of the rapidly expanding interest and activity in the area of the Gunn effect, the following bibliography has been compiled for people who are studying or doing research in this area. The term "Gunn effect" is used, in general, to collectively describe a number of classes of bulk negative resistance behavior in semiconductors with energy band structures like that of GaAs. These modes of behavior include small-signal amplification, pure accumulation of space charge, mature dipole (true Gunn effect) mode. quenched accumulation (LSA) mode, and quenched dipole mode. These references deal with the theory, experimental results, and applications of the Gunn effect. Works of a fundamental nature concerning phenomena that are basic to all semiconductor behavior and other bulk negative resistance effects have not been included. Also, basic papers dealing with electron transport phenomena, such as hot electron theory and intervalley scattering, which are essential to a complete understanding of the Gunn effect and articles on the properties and band structure of GaAs, InP, CdTe, and other III-V compounds have not generally been included, although in certain cases they are listed if they have been frequently cited. As in the compilation of any bibliography, it is self-evident that some valuable and pertinent articles may have been overlooked.
  • Keywords
    Bibliographies; Conductivity; Electric breakdown; Electrons; Gallium arsenide; Germanium; Gunn devices; III-V semiconductor materials; Semiconductor diodes; Solids;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16514
  • Filename
    1475416