DocumentCode
1034688
Title
Effect of collector design on hot-spot formation and second breakdown in transistors
Author
Reich, B. ; Hakim, E.B.
Volume
16
Issue
2
fYear
1969
fDate
2/1/1969 12:00:00 AM
Firstpage
224
Lastpage
225
Keywords
Breakdown voltage; Chromium; Conductivity; Electric breakdown; Electric resistance; Electrical resistance measurement; Infrared detectors; Temperature measurement; Thermal factors; Thermal resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16596
Filename
1475638
Link To Document