An improved operating mode for a Si(Li) X-ray spectrometer

Author

Madden, N.W. ; Goulding, F.S. ; Jaklevic, J.M. ; Landis, D.A. ; Rossington, C.S.

Author_Institution

Eng. Div., Lawrence Berkeley Lab., CA, USA

Volume

37

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

171

Lastpage

176

Abstract

A novel technique has been developed for restoring the charge to the feedback capacitor in charge-sensitive preamplifiers. the method, transient-reset, was developed for use in very-low-noise Si(Li) X-ray spectrometers. It has proved valuable as a diagnostic tool for evaluating the noise components of the input circuit in these systems. The technique is described and compared with the pulsed-light and transistor-reset methods. To complement the charge restoration technique, a new configuration of Si(Li) X-ray detector with a very thin aluminum entrance window has been developed. Measurements of the effective window thickness are compared with similar results obtained on gold, nickel, and ion-implanted boron contacts

Keywords

X-ray spectrometers; elemental semiconductors; lithium; silicon; Si:Li; X-ray spectrometers; charge restoration technique; charge-sensitive preamplifiers; feedback capacitor; Aluminum; Capacitors; Circuit noise; Feedback; Gold; Nickel; Preamplifiers; Spectroscopy; Thickness measurement; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.106613

Filename

106613