• DocumentCode
    1036280
  • Title

    Electromigration in thin gold films

  • Author

    Hartman, Thomas E. ; Blair, James C.

  • Author_Institution
    Texas Instruments Inc., Dallas, Tex.
  • Volume
    16
  • Issue
    4
  • fYear
    1969
  • fDate
    4/1/1969 12:00:00 AM
  • Firstpage
    407
  • Lastpage
    410
  • Abstract
    Electromigration in gold film conductors results in regions of material accumulation and depletion. These regions arise from and are correlated with the thermal gradients along the conductor. This result is in contrast with the observations on aluminum conductors where the effect is dominated by the structure or metallurgical properties of the film.
  • Keywords
    Aluminum; Anodes; Conducting materials; Conductive films; Electromigration; Electrons; Electrostatics; Gold; Temperature; Transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1969.16766
  • Filename
    1475808
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1036280