DocumentCode
1036381
Title
Characterising the UHF factory radio channel
Author
Rappaport, T.S. ; McGillem, C.D.
Author_Institution
Purdue University, Engineering Research Centre for Intelligent Manufacturing Systems, West Lafayette, USA
Volume
23
Issue
19
fYear
1987
Firstpage
1015
Lastpage
1017
Abstract
Portable UHF factory multipath measurement apparatus is being used to measure multipath delay profiles and narrowband fading at five large manufacturing sites in the mid-western US. Preliminary data indicate that typical RMS delay spreads range from 100 to 250 ns and that average CW path loss varies as distance to the power 2-2. This work is the first report of extensive multipath measurements in factory environments.
Keywords
factory automation; fading; mobile radio systems; radiowave propagation; 100 to 250 ns; CW path loss; RMS delay spreads; UHF factory radio channel; extensive multipath measurements; factory environments; large manufacturing sites; multipath measurement apparatus; narrowband fading;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19870712
Filename
4258948
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