• DocumentCode
    1037475
  • Title

    Elimination of ambiguity in measurement of permittivity with short-circuited waveguide

  • Author

    Oh, K.H. ; Ong, C.K. ; Tan, B.T.G.

  • Author_Institution
    National University of Singapore, Department of Physics, Singapore
  • Volume
    23
  • Issue
    22
  • fYear
    1987
  • Firstpage
    1181
  • Lastpage
    1183
  • Abstract
    A new experimental parameter is introduced to eliminate the ambiguity in the short-circuited waveguide method for measuring permittivity. The results of our measurements using this technique for some standard materials are also presented.
  • Keywords
    dielectric-loaded waveguides; microwave measurement; permittivity measurement; ambiguity elimination; experimental parameter; measurement of permittivity; microwave permittivity; short-circuited waveguide method; standard materials;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870821
  • Filename
    4259060
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1037475