DocumentCode
1039402
Title
Microwave properties of fine-grain Ni and Mg ferrites
Author
Vrehen, Quirin H F ; Beljers, Hugo G. ; De Lau, Jan G M
Author_Institution
Philips Research Laboratories, Eindhoven, Netherlands
Volume
5
Issue
3
fYear
1969
fDate
9/1/1969 12:00:00 AM
Firstpage
617
Lastpage
621
Abstract
Microwave properties, such as the threshold field hc for the parallel pump instability, the effective linewidth
, and the dielectric loss tangent have been measured for a number of fine-grain Ni and Mg ferrites. Ferrite powders, prepared by spray drying of sulfate solutions and subsequent roasting, were sintered by continuous hot pressing. Grain sizes as small as 0.5 μm in dense materials were so obtained. The Mg ferrites showed excellent microwave properties (
Oe,
Oe,
). The experimental data suggest that the mean free path of parametrically excited spin waves is of the order of the grain diameter. The Ni ferrites showed comparable values of hc but they had much larger dielectric losses (
). Also
is much more strongly affected by the fine graining (up to 410 Oe). The bad magnetic properties of the fine-grain Ni ferrites are tentatively attributed to stresses near the grain boundaries.
, and the dielectric loss tangent have been measured for a number of fine-grain Ni and Mg ferrites. Ferrite powders, prepared by spray drying of sulfate solutions and subsequent roasting, were sintered by continuous hot pressing. Grain sizes as small as 0.5 μm in dense materials were so obtained. The Mg ferrites showed excellent microwave properties (
Oe,
Oe,
). The experimental data suggest that the mean free path of parametrically excited spin waves is of the order of the grain diameter. The Ni ferrites showed comparable values of h
). Also
is much more strongly affected by the fine graining (up to 410 Oe). The bad magnetic properties of the fine-grain Ni ferrites are tentatively attributed to stresses near the grain boundaries.Keywords
Ferrites; Magnesium ferrites; Microwave magnetic materials; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Ferrites; Loss measurement; Magnetic field measurement; Microwave measurements; Powders; Pressing; Spraying;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1969.1066438
Filename
1066438
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