• DocumentCode
    1041226
  • Title

    Single event phenomena in atmospheric neutron environments

  • Author

    Gossett, C.A. ; Hughlock, B.W. ; Katoozi, M. ; LaRue, G.S. ; Wender, S.A.

  • Author_Institution
    Boeing Defense & Space Group, Seattle, WA, USA
  • Volume
    40
  • Issue
    6
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    1845
  • Lastpage
    1852
  • Abstract
    Describes direct experimental measurements of neutron-induced single event effect (SEE) rates in commercial high-density static random access memories in a neutron environment characteristic of that at commercial airplane altitudes. The first experimental measurements testing current models for neutron-silicon burst generation rates are presented, as well as measurements of charge collection in silicon test structures as a function of neutron energy. These are the first laboratory SEE and charge collection measurements using a particle beam having a continuum energy spectrum and with a shape nearly identical to that observed during flight. Significant inaccuracies in the presently accepted models for predicting SEU rates in an atmospheric environment are noted, and an experimental basis for development of a more accurate model is provided
  • Keywords
    SRAM chips; charge measurement; integrated circuit testing; neutron effects; SEU rates; atmospheric neutron environments; charge collection; charge collection measurements; commercial airplane altitudes; neutron energy; neutron-induced single event effect; neutron-silicon burst generation rates; static random access memories; Atmospheric measurements; Atmospheric modeling; Charge measurement; Current measurement; Energy measurement; Neutrons; Particle beam measurements; Predictive models; Shape measurement; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.273471
  • Filename
    273471