DocumentCode
1041245
Title
Integration and Test Sequencing for Complex Systems
Author
Boumen, Roel ; De Jong, Ivo S M ; Mestrom, J.M.G. ; van de Mortel-Fronczak, J.M. ; Rooda, J.E.
Author_Institution
ASML Netherlands B.V., Veldhoven
Volume
39
Issue
1
fYear
2009
Firstpage
177
Lastpage
187
Abstract
The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.
Keywords
electronic engineering computing; integrated circuit manufacture; integrated manufacturing systems; large-scale systems; lithography; ASML lithographic manufacturing system; complex manufacturing machine; integration sequencing phase; mathematical model; test sequencing phase; Automatic testing; Electronics industry; Manufacturing systems; Mathematical model; Optimization methods; Performance evaluation; Semiconductor device manufacture; Semiconductor device testing; System testing; Time to market; Integration; manufacturing machines; semiconductor industry; test sequencing; test strategy;
fLanguage
English
Journal_Title
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
Publisher
ieee
ISSN
1083-4427
Type
jour
DOI
10.1109/TSMCA.2008.2006374
Filename
4717832
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