• DocumentCode
    1041245
  • Title

    Integration and Test Sequencing for Complex Systems

  • Author

    Boumen, Roel ; De Jong, Ivo S M ; Mestrom, J.M.G. ; van de Mortel-Fronczak, J.M. ; Rooda, J.E.

  • Author_Institution
    ASML Netherlands B.V., Veldhoven
  • Volume
    39
  • Issue
    1
  • fYear
    2009
  • Firstpage
    177
  • Lastpage
    187
  • Abstract
    The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.
  • Keywords
    electronic engineering computing; integrated circuit manufacture; integrated manufacturing systems; large-scale systems; lithography; ASML lithographic manufacturing system; complex manufacturing machine; integration sequencing phase; mathematical model; test sequencing phase; Automatic testing; Electronics industry; Manufacturing systems; Mathematical model; Optimization methods; Performance evaluation; Semiconductor device manufacture; Semiconductor device testing; System testing; Time to market; Integration; manufacturing machines; semiconductor industry; test sequencing; test strategy;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/TSMCA.2008.2006374
  • Filename
    4717832