DocumentCode
1042262
Title
Exact maximum likelihood estimation using masked system data
Author
Lin, Dennis K J ; Usher, John S. ; Guess, Frank M.
Author_Institution
Dept. of Stat., Tennessee Univ., Knoxville, TN, USA
Volume
42
Issue
4
fYear
1993
fDate
12/1/1993 12:00:00 AM
Firstpage
631
Lastpage
635
Abstract
This work estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. The authors extend the results of Usher and Hodgson (1988) by deriving exact maximum likelihood estimators (MLE) for the general case of a series system of three exponential components with independent masking. Their previous work shows that closed-form MLE are intractable, and they propose an iterative method for the solution of a system of three nonlinear likelihood equations
Keywords
failure analysis; iterative methods; maximum likelihood estimation; reliability; component reliability; exact maximum likelihood estimation; iterative method; masked series-system life data; masked system data; nonlinear likelihood equations; Assembly systems; Associate members; Circuits; Closed-form solution; Failure analysis; Iterative methods; Life estimation; Maximum likelihood estimation; Nonlinear equations; Risk analysis;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.273596
Filename
273596
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