• DocumentCode
    1043004
  • Title

    Logic of constraints: a quantitative performance and functional constraint formalism

  • Author

    Chen, Xi ; Hsieh, Harry ; Balarin, Felice ; Watanabe, Yosinori

  • Author_Institution
    Univ. of California, Riverside, CA, USA
  • Volume
    23
  • Issue
    8
  • fYear
    2004
  • Firstpage
    1243
  • Lastpage
    1255
  • Abstract
    In the era of billion-transistor design, it is critical to establish effective verification methodologies from the system level, all the way down to the implementations. In this paper, we introduce logic of constraints (LOC), a logic that is particularly suited to express quantitative performance constraints as well as functional constraints. We analyze the expressiveness of LOC and show that it is important and different from linear temporal logic, upon which traditional hardware assertion languages (e.g., PSL and OpenVera) are based. We propose an automatic simulation trace checking/runtime monitoring methodology that can be used to verify system designs very efficiently. Since a subset of LOC is decidable, we also discuss the formal verification approach for LOC formulas. Through several industrial case studies, we demonstrate the usefulness of the LOC formalism and the corresponding simulation and verification approach at the higher transaction level of abstraction.
  • Keywords
    formal verification; high level synthesis; logic design; temporal logic; LOC formulas; abstraction level; automatic simulation trace checking; billion-transistor design; formal verification; functional constraints; hardware assertion languages; linear temporal logic; logic of constraints; quantitative performance constraints; runtime monitoring methodology; simulation checker; system designs verification; system level; trace analysis; Analytical models; Computerized monitoring; Design methodology; Formal verification; Hardware design languages; Helium; Lab-on-a-chip; Logic design; Performance analysis; Runtime; LOC; Logic of constraints; performance constraint; simulation checker; trace analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.831575
  • Filename
    1317004